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Integrated electronic circuits lab
Integrated electronic circuits lab
Lab Devices
Device name |
Device Tests |
Digital storage oscilloscope Agilent model DSOX3014A | It is able to sample, store, and display higher frequency signals. One million waveforms per second update rate MegaZoom IV smart memory technology. |
Thin film surface profiler model F20EXR with contact probe CP-1-1.3. | -Thickness and refractive index can be measured in less than a second. |
Wire bonder tpt wire bonder hb10. | Attach Micro-chips to a pack through wire bonding - Ultrasound-cold wire welding |
TPT wire bonder Germany semi-automatic wire bonding machine model HB10 | Provides the user the access to all bonds parameters and bondings recopies stored in the machine |
auxiliary lens 2x zoom stereo microscope | low magnification observation of a sample |
Programmer DC power supply model spd3303x | supports Remote Programming and has a Real Time Wave Display |
E4980A Agilent LCR Meter | Measuring of both low and high impedance ranges for components and materials. |
Analog Signal Generator 6 GHz (TSG4104A: E1) | RF Vector Signal Generator offers mid-range performance and up to 200 MHz modulation bandwidth - This instrument complement other leading mid-range RF test solutions from Tektronix, such as the USB-based RSA306 Spectrum Analyzer and MDO4000B and MDO3000 Mixed Domain Oscilloscopes |
Mixed Domain Oscilloscope (Tektronix MDO4000C) | Measure Frequency vs. time, amplitude vs. time, and phase vs. time waveforms. Up to 1GHz bandwidth Up to 5 GS/s sample rate |
Mixed Domain Oscilloscope (Tektronix MDO4104C-SA6 | Enables viewing an entire system behavior - analog, digital, and RF, time-synchronized to understand its true behavior, Frequency range of the Mixed Domain Oscilloscope up to 6 GHz. |
Keithley 4200A-SCS Parameter Analyzer | Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements. |